Understanding Physico-Chemical Aspects in the Depth Profiling of Polymer: Fullerene Layers

Supriya Surana, Thierry Conard, Claudia Fleischmann, Jeffrey G. Tait, João P. Bastos, Eszter Voroshazi, Rasmus Havelund, Mathieu Turbiez, Pierre Louette, Alexandre Felten, Claude Poleunis, Arnaud Delcorte, Wilfried Vandervorst

Research output: Contribution to journal › Article › peer-review

2 results
- Title(descending)

ELISE (XPS and ToF SIMS)
Pierre Louette (Manager)
Facility/equipment: Equipment
Synthesis, Irradiation and Analysis of Materials (SIAM)
Pierre Louette (Manager), Julien Colaux (Manager), Alexandre Felten (Manager), Tijani Tabarrant (Operator), Frederic COME (Operator) & Paul-Louis Debarsy (Manager)
Technological Platform Synthesis, Irradiation and Analysis of Materials
Facility/equipment: Technological Platform