Transmission scanning near-field optical microscopy with uncoated silicon tips

Hans U. Danzebrink, Annick Castiaux, Christian Girard, Xavier Bouju, Günter Wilkening

Research output: Contribution to journalArticlepeer-review


In this paper we report on the implementation of an uncoated silicon (Si) cantilever probe into a transmission scanning near-field optical microscopy (SNOM) architecture. In a first stage, the expected transmission behaviour of a sharp silicon probe is investigated by calculating the complete electric field distribution both inside and outside a silicon tip facing a sample. Experimental applications using near-infrared radiation λ = 1.06 μm) are then proposed. In particular, compact disc features (Ax ≤ 1 μm) were imaged successfully with our setup (lateral resolution: better than 250 nm). Furthermore, when dealing with finer sample structures (Δx ≤ 100 nm), topography artifacts were clearly evidenced. The resulting highly resolved images of nanostructures are to be attributed to some interference effects occurring between the illuminated probe and the sample.

Original languageEnglish
Pages (from-to)371-377
Number of pages7
Issue number1-4
Publication statusPublished - 1 Mar 1998
EventProceedings of the 1997 4th International Conference on Near-Field Optics and Related Techniques, NFO-4 - Jerusalem, Israel
Duration: 9 Feb 199713 Feb 1997


  • Atomic-force microscopy (AFM)
  • Near-field optical microscopy (NFOM)
  • Tip- scanning instrumentation design and characterization


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