TY - JOUR
T1 - Towards solution-processed ambipolar organic thin film transistors based on a,ω-hexyl-distyryl-bithiophene (DH-DS 2T) and a fluorocarbon-substituted dicyanoperylene (PDIF-CN 2)
AU - Nénon, S
AU - Watanabe, T
AU - Brisset, H
AU - Chen, Z
AU - Ackermann, J
AU - Fages, F
AU - Bernardini, S
AU - Aguir, K
AU - Yoshimoto, N
PY - 2012
Y1 - 2012
N2 - Drop casting of solutions based on oligomers as active layers in organic thin film transistors (OTFTs) was studied towards the realization of solution-processed ambipolar devices. As p- and n-type semiconductors, a,?-hexyl-distyryl-bithiophene (DH-DS T) and N,N'-1H,1H- perfluorobutyl dicyanoperylenediimide (PDIF-CN2) were used, respectively. Solutions were prepared by mixing different ratios of PDIF-CN2 versus DH-DS T. Structure and morphology of thin films were studied by Xray diffraction (XRD) and atomic force microscopy (AFM). With the fine tuning of PDIF-CN2 amount, both p- and n- charge carrier transport could be measured in OTFT devices based on blend DH-DS T:PDIF-CN2 as active layer to form so-called ambipolar OTFTs.
AB - Drop casting of solutions based on oligomers as active layers in organic thin film transistors (OTFTs) was studied towards the realization of solution-processed ambipolar devices. As p- and n-type semiconductors, a,?-hexyl-distyryl-bithiophene (DH-DS T) and N,N'-1H,1H- perfluorobutyl dicyanoperylenediimide (PDIF-CN2) were used, respectively. Solutions were prepared by mixing different ratios of PDIF-CN2 versus DH-DS T. Structure and morphology of thin films were studied by Xray diffraction (XRD) and atomic force microscopy (AFM). With the fine tuning of PDIF-CN2 amount, both p- and n- charge carrier transport could be measured in OTFT devices based on blend DH-DS T:PDIF-CN2 as active layer to form so-called ambipolar OTFTs.
KW - ambipolar transport,drop casting,morphology,organic semiconductors,x-ray diffraction
UR - http://www.scopus.com/inward/record.url?scp=84860433565&partnerID=8YFLogxK
M3 - Article
SN - 1454-4164
VL - 14
SP - 131
EP - 135
JO - Journal of Optoelectronics and Advanced Materials
JF - Journal of Optoelectronics and Advanced Materials
IS - 1-2
ER -