Towards Security-aware Mutation Testing

Thomas Loise, Xavier Devroey, Gilles Perrouin, Mike Papadakis, Patrick Heymans

Research output: Contribution in Book/Catalog/Report/Conference proceeding › Conference contribution

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Thesis-X-Devroey: Behavioural Model Based Testing of Software Product Lines
Devroey, X., Heymans, P., Schobbens, P. Y. & Perrouin, G.
1/09/11 → 30/08/17
Project: PHD