TOF-SIMS depth profiling of multilayer amino-acid films using large Argon cluster Arn+, C60+ and Cs+ sputtering ions: A comparative study

N. Wehbe, T. Tabarrant, J. Brison, T. Mouhib, A. Delcorte, P. Bertrand, R. Moellers, E. Niehuis, L. Houssiau

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