Abstract
Three-dimensional intercalated porous graphene has been formed on Si(111) by electron beam evaporation under appropriate conditions and its structural and electronic properties investigated in detail by reflection high-energy electron diffraction, x-ray photoemission spectroscopy, Raman spectroscopy, high-resolution scanning electron microscopy, atomic force microscopy, and scanning tunneling microscopy. The results show that the crystalline quality of the porous graphene depended not only on the substrate temperature but also on the SiC layer thickness during carbon atom deposition.
| Original language | English |
|---|---|
| Pages (from-to) | 1575-1582 |
| Number of pages | 8 |
| Journal | Journal of Electronic Materials |
| Volume | 47 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - 19 Nov 2017 |
Keywords
- 3D graphene
- amorphous carbon
- electron beam evaporation
- graphene on Si(111)
- graphitic carbon
- porous graphene
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Dive into the research topics of 'Three-Dimensional Intercalated Porous Graphene on Si(111)'. Together they form a unique fingerprint.Equipment
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Scanning Tunneling Microscopy
Robert Sporken (Manager)
Technological Platform Morphology - ImagingFacility/equipment: Equipment
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Synthesis, Irradiation and Analysis of Materials (SIAM)
Pierre Louette (Manager), Julien Colaux (Manager), Alexandre Felten (Manager), Tijani Tabarrant (Operator), Frederic COME (Operator) & Paul-Louis Debarsy (Manager)
Technological Platform Synthesis, Irradiation and Analysis of MaterialsFacility/equipment: Technological Platform