Original language | English |
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Pages (from-to) | 67-78 |
Number of pages | 12 |
Journal | Journal of Electron Spectroscopy and Related Phenomena |
Volume | 52 |
Publication status | Published - 1990 |
Externally published | Yes |
The Sm/Si(100) interface studied by electron spectroscopy
Jens Onsgaard, Jacques Ghijsen, Robert L. Johnson, F. Ørskov, Ib Chorkendorff, François Grey
Research output: Contribution to journal › Article › peer-review