Extended abstract: Test them all, is it worth it? Assessing configuration sampling on the JHipster Web development stack

Alexandre Nuttinck; Mathieu Acher; Xavier Devroey; Gilles Perrouin; Benoit Baudry; Axel Halin

doi:10.1145/3382025.3414985

Extended abstract: Test them all, is it worth it? Assessing configuration sampling on the JHipster Web development stack

Alexandre Nuttinck, Mathieu Acher, Xavier Devroey, Gilles Perrouin, Benoit Baudry, Axel Halin

Faculty of Computer Science

Research output: Contribution in Book/Catalog/Report/Conference proceeding › Conference contribution

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Abstract

This is an extended abstract of the article: Axel Halin, Alexandre Nuttinck, Mathieu Acher, Xavier Devroey, Gilles Perrouin, and Benoit Baudry. 2018. Test them all, is it worth it? Assessing configuration sampling on the JHipster Web development stack. In Empirical Software Engineering (17 Jul 2018). https://doi.org/10.1007/s10664-018-9635-4.

Original language	English
Title of host publication	Proceedings of the 24th ACM Conference on Systems and Software Product Line
Editors	Shaukat Ali, Wesley K.G. Assuncao, Thorsten Berger, Carlos Cetina, Philippe Collet, Jose Galindo, Paul Gazzillo, Lukas Linsbauer, Roberto Erick Lopez-Herrejon, Sarah Nadi, Sandro Schulze, Salvador Trujillo
Publisher	ACM Press
Pages	302
Number of pages	1
ISBN (Electronic)	9781450375696
DOIs	https://doi.org/10.1145/3382025.3414985
Publication status	Published - 19 Oct 2020
Event	24th ACM Conference on Systems and Software Product Line, SPLC 2020 - Virtual, Online, Canada Duration: 19 Oct 2020 → 23 Oct 2020

Publication series

Name	ACM International Conference Proceeding Series
Volume	Part F164267-A

Conference

Conference	24th ACM Conference on Systems and Software Product Line, SPLC 2020
Country/Territory	Canada
City	Virtual, Online
Period	19/10/20 → 23/10/20

Keywords

case study
configuration sampling
JHipster
software testing
variability-intensive systems

Access to Document

10.1145/3382025.3414985

2020_HalinAEtAl_articleAccepted author manuscript, 295 KB

Cite this

Nuttinck, A., Acher, M., Devroey, X., Perrouin, G., Baudry, B., & Halin, A. (2020). Extended abstract: Test them all, is it worth it? Assessing configuration sampling on the JHipster Web development stack. In S. Ali, W. K. G. Assuncao, T. Berger, C. Cetina, P. Collet, J. Galindo, P. Gazzillo, L. Linsbauer, R. E. Lopez-Herrejon, S. Nadi, S. Schulze, & S. Trujillo (Eds.), Proceedings of the 24th ACM Conference on Systems and Software Product Line (pp. 302). (ACM International Conference Proceeding Series; Vol. Part F164267-A). ACM Press. https://doi.org/10.1145/3382025.3414985

Nuttinck, Alexandre ; Acher, Mathieu ; Devroey, Xavier et al. / Extended abstract: Test them all, is it worth it? Assessing configuration sampling on the JHipster Web development stack. Proceedings of the 24th ACM Conference on Systems and Software Product Line. editor / Shaukat Ali ; Wesley K.G. Assuncao ; Thorsten Berger ; Carlos Cetina ; Philippe Collet ; Jose Galindo ; Paul Gazzillo ; Lukas Linsbauer ; Roberto Erick Lopez-Herrejon ; Sarah Nadi ; Sandro Schulze ; Salvador Trujillo. ACM Press, 2020. pp. 302 (ACM International Conference Proceeding Series).

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title = "Extended abstract: Test them all, is it worth it? Assessing configuration sampling on the JHipster Web development stack",

abstract = "This is an extended abstract of the article: Axel Halin, Alexandre Nuttinck, Mathieu Acher, Xavier Devroey, Gilles Perrouin, and Benoit Baudry. 2018. Test them all, is it worth it? Assessing configuration sampling on the JHipster Web development stack. In Empirical Software Engineering (17 Jul 2018). https://doi.org/10.1007/s10664-018-9635-4.",

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author = "Alexandre Nuttinck and Mathieu Acher and Xavier Devroey and Gilles Perrouin and Benoit Baudry and Axel Halin",

note = "Publisher Copyright: {\textcopyright} 2020 ACM. Copyright: Copyright 2020 Elsevier B.V., All rights reserved.; 24th ACM Conference on Systems and Software Product Line, SPLC 2020 ; Conference date: 19-10-2020 Through 23-10-2020",

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Nuttinck, A, Acher, M , Devroey, X , Perrouin, G, Baudry, B & Halin, A 2020, Extended abstract: Test them all, is it worth it? Assessing configuration sampling on the JHipster Web development stack. in S Ali, WKG Assuncao, T Berger, C Cetina, P Collet, J Galindo, P Gazzillo, L Linsbauer, RE Lopez-Herrejon, S Nadi, S Schulze & S Trujillo (eds), Proceedings of the 24th ACM Conference on Systems and Software Product Line. ACM International Conference Proceeding Series, vol. Part F164267-A, ACM Press, pp. 302, 24th ACM Conference on Systems and Software Product Line, SPLC 2020, Virtual, Online, Canada, 19/10/20. https://doi.org/10.1145/3382025.3414985

Extended abstract: Test them all, is it worth it? Assessing configuration sampling on the JHipster Web development stack. / Nuttinck, Alexandre; Acher, Mathieu ; Devroey, Xavier et al.
Proceedings of the 24th ACM Conference on Systems and Software Product Line. ed. / Shaukat Ali; Wesley K.G. Assuncao; Thorsten Berger; Carlos Cetina; Philippe Collet; Jose Galindo; Paul Gazzillo; Lukas Linsbauer; Roberto Erick Lopez-Herrejon; Sarah Nadi; Sandro Schulze; Salvador Trujillo. ACM Press, 2020. p. 302 (ACM International Conference Proceeding Series; Vol. Part F164267-A).

Research output: Contribution in Book/Catalog/Report/Conference proceeding › Conference contribution

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Nuttinck A, Acher M , Devroey X , Perrouin G, Baudry B, Halin A. Extended abstract: Test them all, is it worth it? Assessing configuration sampling on the JHipster Web development stack. In Ali S, Assuncao WKG, Berger T, Cetina C, Collet P, Galindo J, Gazzillo P, Linsbauer L, Lopez-Herrejon RE, Nadi S, Schulze S, Trujillo S, editors, Proceedings of the 24th ACM Conference on Systems and Software Product Line. ACM Press. 2020. p. 302. (ACM International Conference Proceeding Series). doi: 10.1145/3382025.3414985

Extended abstract: Test them all, is it worth it? Assessing configuration sampling on the JHipster Web development stack

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