Study of the Pd-Rh interdiffusion by three complementary analytical techniques: PIXE, RBS and ToF-SIMS

R.L. Hubert, J. Brison, L. Houssiau, S. Lucas

Research output: Contribution to journalArticle

Abstract

Pd diffusion in Rh has a great interest in the Pd* production intended to brachytherapy, a cancer treatment using radioactive implants. In order to study that diffusion, DC-magnetron sandwich layers of natural Pd and Rh were produced, annealed, and the Pd profiles were measured by ToF-SIMS. Nevertheless, because ToF-SIMS depth profiles suffer from a lack of quantification and depth calibration, the study was completed by RBS, PIXE. The combination of these techniques allowed us to convert the ToF-SIMS depth profiles from an intensity-time to a concentration-depth profile and thus to study the Pd diffusion in Rh.
Original languageEnglish
Pages (from-to)420-424
Number of pages5
JournalNuclear instruments and methods in physics research B
Volume240
Issue number1-2
DOIs
Publication statusPublished - 1 Oct 2005

    Fingerprint

Cite this