Study of the Pd-Rh interdiffusion by three complementary analytical techniques: PIXE, RBS and ToF-SIMS

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Abstract

Pd diffusion in Rh has a great interest in the Pd* production intended to brachytherapy, a cancer treatment using radioactive implants. In order to study that diffusion, DC-magnetron sandwich layers of natural Pd and Rh were produced, annealed, and the Pd profiles were measured by ToF-SIMS. Nevertheless, because ToF-SIMS depth profiles suffer from a lack of quantification and depth calibration, the study was completed by RBS, PIXE. The combination of these techniques allowed us to convert the ToF-SIMS depth profiles from an intensity-time to a concentration-depth profile and thus to study the Pd diffusion in Rh.
Original languageEnglish
Pages (from-to)420-424
Number of pages5
JournalNuclear instruments and methods in physics research B
Volume240
Issue number1-2
DOIs
Publication statusPublished - 1 Oct 2005

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Secondary ion mass spectrometry
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title = "Study of the Pd-Rh interdiffusion by three complementary analytical techniques: PIXE, RBS and ToF-SIMS",
abstract = "Pd diffusion in Rh has a great interest in the Pd* production intended to brachytherapy, a cancer treatment using radioactive implants. In order to study that diffusion, DC-magnetron sandwich layers of natural Pd and Rh were produced, annealed, and the Pd profiles were measured by ToF-SIMS. Nevertheless, because ToF-SIMS depth profiles suffer from a lack of quantification and depth calibration, the study was completed by RBS, PIXE. The combination of these techniques allowed us to convert the ToF-SIMS depth profiles from an intensity-time to a concentration-depth profile and thus to study the Pd diffusion in Rh.",
author = "R.L. Hubert and J. Brison and L. Houssiau and S. Lucas",
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AU - Lucas, S.

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N2 - Pd diffusion in Rh has a great interest in the Pd* production intended to brachytherapy, a cancer treatment using radioactive implants. In order to study that diffusion, DC-magnetron sandwich layers of natural Pd and Rh were produced, annealed, and the Pd profiles were measured by ToF-SIMS. Nevertheless, because ToF-SIMS depth profiles suffer from a lack of quantification and depth calibration, the study was completed by RBS, PIXE. The combination of these techniques allowed us to convert the ToF-SIMS depth profiles from an intensity-time to a concentration-depth profile and thus to study the Pd diffusion in Rh.

AB - Pd diffusion in Rh has a great interest in the Pd* production intended to brachytherapy, a cancer treatment using radioactive implants. In order to study that diffusion, DC-magnetron sandwich layers of natural Pd and Rh were produced, annealed, and the Pd profiles were measured by ToF-SIMS. Nevertheless, because ToF-SIMS depth profiles suffer from a lack of quantification and depth calibration, the study was completed by RBS, PIXE. The combination of these techniques allowed us to convert the ToF-SIMS depth profiles from an intensity-time to a concentration-depth profile and thus to study the Pd diffusion in Rh.

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