Abstract
Pd diffusion in Rh has a great interest in the Pd* production intended to brachytherapy, a cancer treatment using radioactive implants. In order to study that diffusion, DC-magnetron sandwich layers of natural Pd and Rh were produced, annealed, and the Pd profiles were measured by ToF-SIMS. Nevertheless, because ToF-SIMS depth profiles suffer from a lack of quantification and depth calibration, the study was completed by RBS, PIXE. The combination of these techniques allowed us to convert the ToF-SIMS depth profiles from an intensity-time to a concentration-depth profile and thus to study the Pd diffusion in Rh.
Original language | English |
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Pages (from-to) | 420-424 |
Number of pages | 5 |
Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
Volume | 240 |
Issue number | 1-2 |
DOIs | |
Publication status | Published - 1 Oct 2005 |
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Synthesis, Irradiation and Analysis of Materials (SIAM)
Pierre Louette (Manager), Julien Colaux (Manager), Alexandre Felten (Manager), Tijani Tabarrant (Operator), Frederic COME (Operator) & Paul-Louis Debarsy (Manager)
Technological Platform Synthesis, Irradiation and Analysis of MaterialsFacility/equipment: Technological Platform