Study of annatto from Bixa orellana seeds: An application of time-of-flight secondary ion mass spectrometry

C. Bittencourt, M.P. Felicissimo, J.-J. Pireaux, L. Houssiau

Research output: Contribution to journalArticle

Abstract

The use of time-of-flight secondary ion mass spectrometry (ToF-SIMS) to analyze natural samples is discussed. The technique allows preventive measures such as protection from light, temperature control, inert atmosphere, and no solvent use to be achieved during the analysis. It is shown that the technique allows the direct measurement on the seed, which is considered to be a new possibility for the analysis of natural samples. The molecular sensitivity of ToF-SIMS has been shown to allow the straightforward detection of the main constituents present in annatto seeds, with potential applications in food industry.
Original languageEnglish
Pages (from-to)16-22
Number of pages7
JournalSpectroscopy Europe
Volume17
Issue number2
Publication statusPublished - 1 Apr 2005

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