The use of time-of-flight secondary ion mass spectrometry (ToF-SIMS) to analyze natural samples is discussed. The technique allows preventive measures such as protection from light, temperature control, inert atmosphere, and no solvent use to be achieved during the analysis. It is shown that the technique allows the direct measurement on the seed, which is considered to be a new possibility for the analysis of natural samples. The molecular sensitivity of ToF-SIMS has been shown to allow the straightforward detection of the main constituents present in annatto seeds, with potential applications in food industry.
|Number of pages||7|
|Publication status||Published - 1 Apr 2005|
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Technological Platform Synthesis, Irradiation and Analysis of Materials
Facility/equipment: Technological Platform