Study of annatto from Bixa orellana seeds: An application of time-of-flight secondary ion mass spectrometry

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Abstract

The use of time-of-flight secondary ion mass spectrometry (ToF-SIMS) to analyze natural samples is discussed. The technique allows preventive measures such as protection from light, temperature control, inert atmosphere, and no solvent use to be achieved during the analysis. It is shown that the technique allows the direct measurement on the seed, which is considered to be a new possibility for the analysis of natural samples. The molecular sensitivity of ToF-SIMS has been shown to allow the straightforward detection of the main constituents present in annatto seeds, with potential applications in food industry.
Original languageEnglish
Pages (from-to)16-22
Number of pages7
JournalSpectroscopy Europe
Volume17
Issue number2
Publication statusPublished - 1 Apr 2005

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Secondary ion mass spectrometry
secondary ion mass spectrometry
Seed
seeds
inert atmosphere
temperature control
food
Temperature control
industries
sensitivity
Industry
annatto

Cite this

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title = "Study of annatto from Bixa orellana seeds: An application of time-of-flight secondary ion mass spectrometry",
abstract = "The use of time-of-flight secondary ion mass spectrometry (ToF-SIMS) to analyze natural samples is discussed. The technique allows preventive measures such as protection from light, temperature control, inert atmosphere, and no solvent use to be achieved during the analysis. It is shown that the technique allows the direct measurement on the seed, which is considered to be a new possibility for the analysis of natural samples. The molecular sensitivity of ToF-SIMS has been shown to allow the straightforward detection of the main constituents present in annatto seeds, with potential applications in food industry.",
author = "C. Bittencourt and M.P. Felicissimo and J.-J. Pireaux and L. Houssiau",
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AU - Bittencourt, C.

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AU - Pireaux, J.-J.

AU - Houssiau, L.

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N2 - The use of time-of-flight secondary ion mass spectrometry (ToF-SIMS) to analyze natural samples is discussed. The technique allows preventive measures such as protection from light, temperature control, inert atmosphere, and no solvent use to be achieved during the analysis. It is shown that the technique allows the direct measurement on the seed, which is considered to be a new possibility for the analysis of natural samples. The molecular sensitivity of ToF-SIMS has been shown to allow the straightforward detection of the main constituents present in annatto seeds, with potential applications in food industry.

AB - The use of time-of-flight secondary ion mass spectrometry (ToF-SIMS) to analyze natural samples is discussed. The technique allows preventive measures such as protection from light, temperature control, inert atmosphere, and no solvent use to be achieved during the analysis. It is shown that the technique allows the direct measurement on the seed, which is considered to be a new possibility for the analysis of natural samples. The molecular sensitivity of ToF-SIMS has been shown to allow the straightforward detection of the main constituents present in annatto seeds, with potential applications in food industry.

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