Abstract
In this study we have grown epitaxial layers of wurtzite–CdS on CdTe()B/Si substrates using molecular beam epitaxy. Indium was used to obtain n-type doping of CdS. The concentration and uniformity of In was determined by secondary ion mass spectrometry (SIMS). Indium profiles were obtained for concentrations ranging from 5×1017 to 1.4×1021 cm−3 and agree well with the variation expected from the In flux.
Original language | English |
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Pages (from-to) | 975-979 |
Number of pages | 5 |
Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
Volume | 161-163 |
DOIs | |
Publication status | Published - 2000 |