Original language | English |
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Pages (from-to) | 1054-1059 |
Number of pages | 6 |
Journal | Surface Science |
Volume | 269-270 |
Publication status | Published - 1992 |
Silicon oxynitride and aluminum films interface : Rutherford backscattering and high resolution electron-energy-loss spectroscopic studies
Deda Diatezua Manpuya, Paul Thiry, Guy Terwagne, Roland Caudano
Research output: Contribution to journal › Article › peer-review
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