TY - JOUR
T1 - Shelf-life time test of p- and n-channel organic thin film transistors using copper phthalocyanines
AU - Nénon, S.
AU - Fages, F.
AU - Videlot-Ackermann, C.
AU - Kanehira, D.
AU - Yoshimoto, N.
PY - 2010/7/30
Y1 - 2010/7/30
N2 - P- and n-type channel thin film transistors (OTFTs) were fabricated by using hexadecahydrogen copper phthalocyanine (HCuPc) and hexadecafluoro copper phthalocyanine (FCuPc) molecules, respectively. Top-contact and bottom-contact source-drain configurations were used for both semiconductors. Furthermore, the temperature and film thickness dependences on the mobility values were measured in the saturation regime of source-drain current. Unipolar mobilities in such single-layer OTFTs were correlated to thin film morphology by X-ray diffraction analysis and atomic force microscopy measurements. Shelf-life time tests of p-type and n-type OTFTs are detailed as OTFT configuration and substrate temperature dependence over a time period of 100 days.
AB - P- and n-type channel thin film transistors (OTFTs) were fabricated by using hexadecahydrogen copper phthalocyanine (HCuPc) and hexadecafluoro copper phthalocyanine (FCuPc) molecules, respectively. Top-contact and bottom-contact source-drain configurations were used for both semiconductors. Furthermore, the temperature and film thickness dependences on the mobility values were measured in the saturation regime of source-drain current. Unipolar mobilities in such single-layer OTFTs were correlated to thin film morphology by X-ray diffraction analysis and atomic force microscopy measurements. Shelf-life time tests of p-type and n-type OTFTs are detailed as OTFT configuration and substrate temperature dependence over a time period of 100 days.
UR - http://www.scopus.com/inward/record.url?scp=77955660173&partnerID=8YFLogxK
U2 - 10.1016/j.tsf.2010.04.035
DO - 10.1016/j.tsf.2010.04.035
M3 - Article
AN - SCOPUS:77955660173
SN - 0040-6090
VL - 518
SP - 5593
EP - 5598
JO - Thin Solid Films
JF - Thin Solid Films
IS - 19
ER -