Resonant scanning tunneling optical microscope

Claudine Bainier; Daniel A. Courjon; J. Salvi; Fadi Baida; Christian Girard; Jean Marie Vigoureux; A. Castiaux

doi:10.1117/12.250788

Resonant scanning tunneling optical microscope

Claudine Bainier, Daniel A. Courjon, J. Salvi, Fadi Baida, Christian Girard, Jean Marie Vigoureux, A. Castiaux

University of Namur

Research output: Contribution to journal › Conference article › peer-review

Abstract

It has been shown recently that a configuration combining near field detection and Fabry-Perot resonator offers a solution for increasing the signal to noise ratio. In this communication we use this conference as an interferometric imaging device. The basic idea behind this concept is that one way for enhancing the low sensitivity of such microscopes could consist of increasing the field intensity between tip and sample by either using a multi-reflection system such as a classical Fabry-Perot cavity or by using some more sophisticated multi-reflection devices.

Original language	English
Pages (from-to)	582-590
Number of pages	9
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	2782
DOIs	https://doi.org/10.1117/12.250788
Publication status	Published - 1 Dec 2004
Event	Optical Inspection and Micromeasurements - Besancon, France Duration: 10 Jun 1996 → 10 Jun 1996

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AU - Bainier, Claudine

AU - Courjon, Daniel A.

AU - Salvi, J.

AU - Baida, Fadi

AU - Girard, Christian

AU - Vigoureux, Jean Marie

AU - Castiaux, A.

PY - 2004/12/1

Y1 - 2004/12/1

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AB - It has been shown recently that a configuration combining near field detection and Fabry-Perot resonator offers a solution for increasing the signal to noise ratio. In this communication we use this conference as an interferometric imaging device. The basic idea behind this concept is that one way for enhancing the low sensitivity of such microscopes could consist of increasing the field intensity between tip and sample by either using a multi-reflection system such as a classical Fabry-Perot cavity or by using some more sophisticated multi-reflection devices.

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DO - 10.1117/12.250788

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JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Optical Inspection and Micromeasurements

Y2 - 10 June 1996 through 10 June 1996

ER -

Resonant scanning tunneling optical microscope

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