RBS and XPS depth-profiling of Ge-nc synthesized from Ge+ implantation in thin SiO2/Si layers.

Julien Demarche, Pierre Louette, D. Barba, Guy G. Ross, Guy Terwagne

    Research output: Contribution to conferencePosterpeer-review

    Original languageEnglish
    Publication statusIn preparation - 2013
    EventIBA 2013 - Ion Beam Analysis - Seattle - US - Seattle, United States
    Duration: 23 Jul 201228 Jul 2013


    ConferenceIBA 2013 - Ion Beam Analysis - Seattle - US
    Country/TerritoryUnited States

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