Probing the nature of defects in graphene by Raman spectroscopy

A. Eckmann, A. Felten, L. Britnell, A. Mishchenko, R. Krupke, K.S. Novoselov, C. Casiraghi

    Research output: Contribution to journalArticlepeer-review

    Abstract

    Raman spectroscopy is able to probe disorder in graphene through defect-activated peaks. It is of great interest to link these features to the nature of disorder. Here we present a detailed analysis of the Raman spectra of graphene containing different type of defects. We found that the intensity ratio of the D and D′ peak is maximum (∼13) for sp -defects, it decreases for vacancy-like defects (∼7), and it reaches a minimum for boundaries in graphite (∼3.5). This makes Raman Spectroscopy a powerful tool to fully characterize graphene.
    Original languageEnglish
    Pages (from-to)3925-3930
    Number of pages6
    JournalNano Letters
    Volume12
    Issue number8
    DOIs
    Publication statusPublished - 8 Aug 2012

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