Potentialities of the Gelius intensity model in quality control of valence XPS measurements

Joseph Riga, Jean-Pol BOUTIQUE, Jacques Verbist, Joseph Delhalle, Joseph Fripiat

    Research output: Contribution to journalArticle

    Original languageEnglish
    Pages (from-to)263-268
    Number of pages6
    JournalJ. Electron Spectrosc.
    Volume33
    Publication statusPublished - 1984

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