Potentialities of the Gelius intensity model in quality control of valence XPS measurements

Joseph Riga; Jean-Pol BOUTIQUE; Jacques Verbist; Joseph Delhalle; Joseph Fripiat

doi:10.1016/0368-2048(84)80022-5

Potentialities of the Gelius intensity model in quality control of valence XPS measurements

Joseph Riga, Jean-Pol BOUTIQUE, Jacques Verbist, Joseph Delhalle, Joseph Fripiat

Research output: Contribution to journal › Article

Abstract

The Gelius intensity model is shown to be a useful tool to check the quality of XPS valence spectra, in order to be aware of experimental data biased by electrons originating from the sample support.

Original language	English
Pages (from-to)	263-268
Number of pages	6
Journal	Journal of Electron Spectroscopy and Related Phenomena
Volume	33
Issue number	3
DOIs	https://doi.org/10.1016/0368-2048(84)80022-5
Publication status	Published - 1984

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title = "Potentialities of the Gelius intensity model in quality control of valence XPS measurements",

abstract = "The Gelius intensity model is shown to be a useful tool to check the quality of XPS valence spectra, in order to be aware of experimental data biased by electrons originating from the sample support.",

author = "Joseph Riga and Jean-Pol BOUTIQUE and Jacques Verbist and Joseph Delhalle and Joseph Fripiat",

year = "1984",

doi = "10.1016/0368-2048(84)80022-5",

language = "English",

volume = "33",

pages = "263--268",

journal = "Journal of Electron Spectroscopy and Related Phenomena",

issn = "0368-2048",

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T1 - Potentialities of the Gelius intensity model in quality control of valence XPS measurements

AU - Riga, Joseph

AU - BOUTIQUE, Jean-Pol

AU - Verbist, Jacques

AU - Delhalle, Joseph

AU - Fripiat, Joseph

PY - 1984

Y1 - 1984

N2 - The Gelius intensity model is shown to be a useful tool to check the quality of XPS valence spectra, in order to be aware of experimental data biased by electrons originating from the sample support.

AB - The Gelius intensity model is shown to be a useful tool to check the quality of XPS valence spectra, in order to be aware of experimental data biased by electrons originating from the sample support.

U2 - 10.1016/0368-2048(84)80022-5

DO - 10.1016/0368-2048(84)80022-5

M3 - Article

SN - 0368-2048

VL - 33

SP - 263

EP - 268

JO - Journal of Electron Spectroscopy and Related Phenomena

JF - Journal of Electron Spectroscopy and Related Phenomena

IS - 3

ER -

Potentialities of the Gelius intensity model in quality control of valence XPS measurements

Abstract

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