Poster: VIBeS, Transition System Mutation Made Easy

Research output: Contribution in Book/Catalog/Report/Conference proceedingConference contribution

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Abstract

Mutation testing is an established technique used to evaluate the quality of a set of test cases. As model-based testing took momentum, mutation techniques were lifted to the model level. However, as for code mutation analysis, assessing test cases on a large set of mutants can be costly. In this paper, we introduce the Variability-Intensive Behavioural teSting (VIBeS) framework. Relying on Featured Transition Systems (FTSs), we represent all possible mutants in a single model constrained by a feature model for mutant (in)activation. This allow to assess all mutants in a single test case execution. We present VIBeS implementation steps and the DSL we defined to ease model-based mutation analysis.

Original languageEnglish
Title of host publicationProceedings - International Conference on Software Engineering
Place of PublicationFlorence, Italy
PublisherIEEE Computer Society Press
Pages817-818
Number of pages2
Volume2
ISBN (Print)9781479919345
DOIs
Publication statusPublished - 12 Aug 2015
Event37th IEEE/ACM International Conference on Software Engineering, ICSE 2015 - Florence, Italy
Duration: 16 May 201524 May 2015

Conference

Conference37th IEEE/ACM International Conference on Software Engineering, ICSE 2015
CountryItaly
CityFlorence
Period16/05/1524/05/15

Fingerprint

Testing
DSL
Momentum
Chemical activation

Keywords

  • Featured Transition Systems
  • Model-Based Mutation Testing
  • VIBeS

Cite this

Devroey, X., Perrouin, G., Schobbens, P., & Heymans, P. (2015). Poster: VIBeS, Transition System Mutation Made Easy. In Proceedings - International Conference on Software Engineering (Vol. 2, pp. 817-818). [7203084] Florence, Italy: IEEE Computer Society Press. https://doi.org/10.1109/ICSE.2015.263
Devroey, Xavier ; Perrouin, Gilles ; Schobbens, Pierre ; Heymans, Patrick. / Poster: VIBeS, Transition System Mutation Made Easy. Proceedings - International Conference on Software Engineering. Vol. 2 Florence, Italy : IEEE Computer Society Press, 2015. pp. 817-818
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Devroey, X, Perrouin, G, Schobbens, P & Heymans, P 2015, Poster: VIBeS, Transition System Mutation Made Easy. in Proceedings - International Conference on Software Engineering. vol. 2, 7203084, IEEE Computer Society Press, Florence, Italy, pp. 817-818, 37th IEEE/ACM International Conference on Software Engineering, ICSE 2015, Florence, Italy, 16/05/15. https://doi.org/10.1109/ICSE.2015.263

Poster: VIBeS, Transition System Mutation Made Easy. / Devroey, Xavier; Perrouin, Gilles; Schobbens, Pierre; Heymans, Patrick.

Proceedings - International Conference on Software Engineering. Vol. 2 Florence, Italy : IEEE Computer Society Press, 2015. p. 817-818 7203084.

Research output: Contribution in Book/Catalog/Report/Conference proceedingConference contribution

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Devroey X, Perrouin G, Schobbens P, Heymans P. Poster: VIBeS, Transition System Mutation Made Easy. In Proceedings - International Conference on Software Engineering. Vol. 2. Florence, Italy: IEEE Computer Society Press. 2015. p. 817-818. 7203084 https://doi.org/10.1109/ICSE.2015.263