XPS measurements of poly(vinyl alcohol) (PVA) recorded with a SSX-100 spectrometer in standardized experimental conditions are presented: survey scan, high resolution core level spectra as well as the energy loss regions of the main elements are analyzed.
|Number of pages||5|
|Journal||Surface science spectra|
|Publication status||Unpublished - 2005|
- vinyl alcohol
- core level
- x-ray photoelectron
FingerprintDive into the research topics of 'Poly(vinyl alcohol) (PVA) XPS reference core level and energy loss spectra'. Together they form a unique fingerprint.
Synthesis, Irradiation and Analysis of Materials (SIAM)
Pierre Louette (Manager), Julien Colaux (Manager), Alexandre Felten (Manager) & Jorge Humberto Mejia Mendoza (Manager)Technological Platform Synthesis, Irradiation and Analysis of Materials
Facility/equipment: Technological Platform