XPS measurements of poly(diallyl phthalate) (PAA) recorded with a SSX-100 spectrometer in standardized experimental conditions are presented: survey scan, high resolution core level spectra as well as the energy loss regions of the main elements are analyzed.
|Number of pages||6|
|Journal||Surface science spectra|
|Publication status||Unpublished - 2005|
- poly(diallyl phthalate)
- diallyl phthalate
- core level
- x-ray photoelectron
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Technological Platform Synthesis, Irradiation and Analysis of Materials
Facility/equipment: Technological Platform