Plasma functionalization of AFM tips for measurement of chemical interactions

C. Volcke; R.P. Gandhiraman; V. Gubala; C. Doyle; G. Fonder; P.A. Thiry; A.A. Cafolla; B. James; D.E. Williams

doi:10.1016/j.jcis.2010.04.042

Plasma functionalization of AFM tips for measurement of chemical interactions

C. Volcke, R.P. Gandhiraman, V. Gubala, C. Doyle, G. Fonder, P.A. Thiry, A.A. Cafolla, B. James, D.E. Williams

Research output: Contribution to journal › Article › peer-review

Abstract

In this paper, a new, fast, reproducible technique for atomic force microscopy (AFM) tips functionalization used for chemical interaction measurements is described. Precisely, the deposition of an aminated precursor is performed through plasma-enhanced chemical vapor deposition (PECVD) in order to create amine functional groups on the AFM tip and cantilever. The advantages of the precursor, aminopropyltriethoxysilane (APTES), were recently demonstrated for amine layer formation through PECVD deposition on polymeric surfaces. We extended this procedure to functionalize AFM probes. Titration force spectroscopy highlights the successful functionalization of AFM tips as well as their stability and use under different environmental conditions.

Original language	English
Pages (from-to)	322-328
Number of pages	7
Journal	Journal of Colloid and Interface Science
Volume	348
Issue number	2
DOIs	https://doi.org/10.1016/j.jcis.2010.04.042
Publication status	Published - 1 Aug 2010

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10.1016/j.jcis.2010.04.042

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AU - Volcke, C.

AU - Gandhiraman, R.P.

AU - Gubala, V.

AU - Doyle, C.

AU - Fonder, G.

AU - Thiry, P.A.

AU - Cafolla, A.A.

AU - James, B.

AU - Williams, D.E.

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Plasma functionalization of AFM tips for measurement of chemical interactions

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