Fingerprint
Dive into the research topics of 'Physical characterization of thin HfO2 layers by the combined analysis with complementary techniques'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Physical characterization of thin HfO2 layers by the combined analysis with complementary techniques
H. Bender, Th. Conard, O. Richard, B. Brijs, J. Pétry, W. Vandervorst, Chr. Defranoux, P. Boher, N. Rochat, C. Wyon, P. Mack, J. Wolstenholme, R. Vitchev, L. Houssiau, J.-J. Pireaux, A. Bergmaier, G. Dollinger
Research output: Contribution to journal › Article › peer-review