Abstract
Thermochromic films of VO were deposited by DC reactive magnetron sputtering on stainless steel substrate. Complex refractive indexes of VO were determined by ellipsometric spectroscopy (0.35-16.5 μm) for different film thicknesses. Optical simulations were performed to model the spectral reflectance of the film/substrate system for a film thickness of 100 nm and 200 nm and to monitor the optical contrast of the thermochromic layers by comparing the spectral reflectance at 25 °C and 100 °C. The good agreement observed between experimental and theoretical spectra demonstrates the adequacy of the model for predicting the optical properties of the samples.
Original language | English |
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Pages (from-to) | 3283-3287 |
Number of pages | 5 |
Journal | Thin Solid Films |
Volume | 519 |
Issue number | 10 |
DOIs | |
Publication status | Published - 1 Mar 2011 |
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Synthesis, Irradiation and Analysis of Materials (SIAM)
Louette, P. (Manager), Colaux, J. (Manager), Felten, A. (Manager), Tabarrant, T. (Operator), COME, F. (Operator) & Debarsy, P.-L. (Manager)
Technological Platform Synthesis, Irradiation and Analysis of MaterialsFacility/equipment: Technological Platform