Abstract
XPS measurements of Nylon 6,6 (N66) recorded with a SSX-100 spectrometer in standardized experimental conditions are presented: survey scan, high resolution core level spectra as well as the energy loss regions of the main elements are analyzed.
| Original language | English |
|---|---|
| Pages (from-to) | 6-11 |
| Number of pages | 6 |
| Journal | Surface science spectra |
| Volume | 12 |
| DOIs | |
| Publication status | Published - 2005 |
Keywords
- surface
- N66
- loss
- spectroscopy
- energy
- XPS
- Nylon
- core level
- x-ray photoelectron
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Synthesis, Irradiation and Analysis of Materials (SIAM)
Pierre Louette (Manager), Julien Colaux (Manager), Alexandre Felten (Manager), Tijani Tabarrant (Operator), Frederic COME (Operator) & Paul-Louis Debarsy (Manager)
Technological Platform Synthesis, Irradiation and Analysis of MaterialsFacility/equipment: Technological Platform