Molecular depth profiling of polymers with very low energy ions

Research output: Contribution to journalArticle

Abstract

polycarbonate, polymethylmethacrylate and polyethylene terephtalate films were depth-profiled with 200 eV Cs+ and 500eV O2+ ions. Best profiles were obtained in the negative mode, due to a strong negative ionisation yield enhancement related to Cs retention in the polymer. A relatively high and stable signal from the most characteristic ions was measured all over the layer. 500eV O2+, real molecular depth-profiles were also obtained on PMMA in both the positive and the negative mode.With Cs implanted, MCsn+ clusters were observed in the positive polarity.
Original languageEnglish
Pages (from-to)3-23
Number of pages21
JournalPhysicalia Magazine
Volume30
Publication statusPublished - 2008

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polymers
polycarbonates
profiles
polyethylenes
polarity
ions
ionization
energy
augmentation

Keywords

  • polymethylmethacrylate
  • Polymer
  • Depth-Profiling
  • polycarbonate
  • polyethylene terephtalate
  • Cesium
  • ToF-SIMS
  • SIMS

Cite this

@article{ed46e595fd1243649ea858b8fe669854,
title = "Molecular depth profiling of polymers with very low energy ions",
abstract = "polycarbonate, polymethylmethacrylate and polyethylene terephtalate films were depth-profiled with 200 eV Cs+ and 500eV O2+ ions. Best profiles were obtained in the negative mode, due to a strong negative ionisation yield enhancement related to Cs retention in the polymer. A relatively high and stable signal from the most characteristic ions was measured all over the layer. 500eV O2+, real molecular depth-profiles were also obtained on PMMA in both the positive and the negative mode.With Cs implanted, MCsn+ clusters were observed in the positive polarity.",
keywords = "polymethylmethacrylate, Polymer, Depth-Profiling, polycarbonate, polyethylene terephtalate, Cesium, ToF-SIMS, SIMS",
author = "Nicolas Mine and Laurent Houssiau",
year = "2008",
language = "English",
volume = "30",
pages = "3--23",
journal = "Physicalia Magazine",

}

Molecular depth profiling of polymers with very low energy ions. / Mine, Nicolas; Houssiau, Laurent.

In: Physicalia Magazine, Vol. 30, 2008, p. 3-23.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Molecular depth profiling of polymers with very low energy ions

AU - Mine, Nicolas

AU - Houssiau, Laurent

PY - 2008

Y1 - 2008

N2 - polycarbonate, polymethylmethacrylate and polyethylene terephtalate films were depth-profiled with 200 eV Cs+ and 500eV O2+ ions. Best profiles were obtained in the negative mode, due to a strong negative ionisation yield enhancement related to Cs retention in the polymer. A relatively high and stable signal from the most characteristic ions was measured all over the layer. 500eV O2+, real molecular depth-profiles were also obtained on PMMA in both the positive and the negative mode.With Cs implanted, MCsn+ clusters were observed in the positive polarity.

AB - polycarbonate, polymethylmethacrylate and polyethylene terephtalate films were depth-profiled with 200 eV Cs+ and 500eV O2+ ions. Best profiles were obtained in the negative mode, due to a strong negative ionisation yield enhancement related to Cs retention in the polymer. A relatively high and stable signal from the most characteristic ions was measured all over the layer. 500eV O2+, real molecular depth-profiles were also obtained on PMMA in both the positive and the negative mode.With Cs implanted, MCsn+ clusters were observed in the positive polarity.

KW - polymethylmethacrylate

KW - Polymer

KW - Depth-Profiling

KW - polycarbonate

KW - polyethylene terephtalate

KW - Cesium

KW - ToF-SIMS

KW - SIMS

M3 - Article

VL - 30

SP - 3

EP - 23

JO - Physicalia Magazine

JF - Physicalia Magazine

ER -