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Measuring point defect density in individual carbon nanotubes using polarization-dependent X-ray microscopy
A. Felten, X. Gillon, M. Gulas, J.-J. Pireaux, X. Ke, G. Van Tendeloo, C. Bittencourt, E. Najafi, A.P. Hitchcock
Research output: Contribution to journal › Article › peer-review