Laterally resolved measurements of polycrystalline cesium iodide surfaces

Petra Rudolf, Frédéric Marchal, Robert Sporken, Roland Caudano, Tiziana Dell'Orto, Jorge Almeida, A. Braem, François Piuz, Stefano Sgobba, Guy Paic, Eugenio Nappi, A. Valentini, Paolo Sartori, Carlo Coluzza

    Research output: Contribution to journalArticle


    The aim of this work was to establish the correlation between the local chemical composition and morphology of polycrystalline cesium iodide (CsI) and its local quantum efficiency. We used a laterally resolved Electron Spectroscopy for Chemical Analysis (ESCA-300) apparatus and a Scanning Auger Microprobe (SAM) to investigate the lateral inhomogeneity of the CsI surface stoichiometry. The local quantum efficiency (QE) was determined by measuring the secondary electron emission in Photoemission Electron Microscopy both with a non-monochromatized deuterium lamp and with tunable X-ray synchrotron radiation as the excitation source. CsI films on different substrates were studied. We found that the local QE depends strongly on the morphology, on the local stoichiometry and on carbon contamination. The results allow for an optimisation of the quantum efficiency of large area photocathodes.
    Original languageEnglish
    Pages (from-to)163-170
    Number of pages8
    JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
    Issue number1-2
    Publication statusPublished - 1997


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