Original language | English |
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Pages (from-to) | 160-174 |
Number of pages | 15 |
Journal | Surface and interface analysis |
Volume | 26 |
Publication status | Published - 1998 |
Investigation of the atomic interdiffusion and phase formation in ion beam irradiated thin Al-Cu and Al-Ag multilayers by in-situ RBS and XRD
Andreas Markwitz, W. Matz, M. Waldschmidt, Guy Demortier
Research output: Contribution to journal › Article