Investigation of methods to enhance the secondary ion yields in TOF-SIMS of organic samples

Chemistry

• Sample 100%
• Time-of-Flight Secondary Ion Mass Spectrometry 100%
• Secondary Ion 100%
• Amount 66%
• Ion Bombardment 66%
• Metal 33%
• Application 33%
• Secondary Ion Mass Spectroscopy 33%
• Environment 33%
• Polymer 33%
• Organic Molecule 33%
• Monoatomic Ion 33%
• Surface Modification 33%
• Polyatomic Ion 33%

Material Science

• Secondary Ion Mass Spectrometry 100%
• Material 66%
• Ion Implantation 66%
• Metal 33%
• Surface 33%
• Polymer 33%
• Materials Science 33%
• Analytical Method 33%