Investigation of metal-GaN and metal-Al,GaN contacts by XPS depth profiles and by electrical measurements

Jacques Dumont, Eva Monroy, Elias Munoz, Roland Caudano, Robert Sporken

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Cite this

@article{8df8e080723e403c9a2c4eae92e7ca6d,

title = "Investigation of metal-GaN and metal-Al,GaN contacts by XPS depth profiles and by electrical measurements",

author = "Jacques Dumont and Eva Monroy and Elias Munoz and Roland Caudano and Robert Sporken",

note = "Publication code : **RES. ACAD.",

year = "2001",

language = "English",

pages = "558--563",

journal = "Journal of Crystal Growth",

publisher = "Elsevier",

number = "230",

}

TY - JOUR

T1 - Investigation of metal-GaN and metal-Al,GaN contacts by XPS depth profiles and by electrical measurements

AU - Dumont, Jacques

AU - Monroy, Eva

AU - Munoz, Elias

AU - Caudano, Roland

AU - Sporken, Robert

N1 - Publication code : **RES. ACAD.

PY - 2001

Y1 - 2001

M3 - Article

SP - 558

EP - 563

JO - Journal of Crystal Growth

JF - Journal of Crystal Growth

IS - 230

ER -