Investigation of metal-GaN and metal-Al,GaN contacts by XPS depth profiles and by electrical measurements

Jacques Dumont, Eva Monroy, Elias Munoz, Roland Caudano, Robert Sporken

    Research output: Contribution to journalArticle

    Original languageEnglish
    Pages (from-to)558-563
    Number of pages6
    JournalJournal of Crystal Growth
    Issue number230
    Publication statusPublished - 2001

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