Investigation of Doppler Broadening of compton line by PIXE

V.E. Nuttens; R.L. Hubert; F. Bodart; S. Lucas

doi:10.1016/j.nimb.2005.06.132

Investigation of Doppler Broadening of compton line by PIXE

V.E. Nuttens, R.L. Hubert, F. Bodart, S. Lucas

Namur Research Institute for Life Sciences

Research output: Contribution to journal › Article › peer-review

Abstract

We have investigated the possibility to highlight the Compton broadening effect using proton-induced X-ray emission. A special configuration of the irradiated sample has been chosen: a very thin rhodium layer deposited on a glassy carbon substrate. The X-rays photons are generated in the thin layer of rhodium owing to the ionisation by the proton irradiation. The substrate is in glassy carbon to prevent it to fluoresce. The PIXE results are compared with Monte-Carlo simulation (MCNPX) and with the theoretical model of DuMond et al. A very good agreement is observed. © 2005 Elsevier B.V. All rights reserved.

Original language	English
Pages (from-to)	293-296
Number of pages	4
Journal	Nuclear Instruments and Methods in Physics Research B- Beam interactions with material and atoms
Volume	240
Issue number	1-2
DOIs	https://doi.org/10.1016/j.nimb.2005.06.132
Publication status	Published - 2005

Keywords

Doppler broadening
Monte-Carlo simulations
PIXE

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10.1016/j.nimb.2005.06.132

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Synthesis, Irradiation and Analysis of Materials (SIAM)
Pierre Louette (Manager), Julien Colaux (Manager), Alexandre Felten (Manager) & Jorge Humberto Mejia Mendoza (Manager)
Technological Platform Synthesis, Irradiation and Analysis of Materials
Facility/equipment: Technological Platform

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title = "Investigation of Doppler Broadening of compton line by PIXE",

abstract = "We have investigated the possibility to highlight the Compton broadening effect using proton-induced X-ray emission. A special configuration of the irradiated sample has been chosen: a very thin rhodium layer deposited on a glassy carbon substrate. The X-rays photons are generated in the thin layer of rhodium owing to the ionisation by the proton irradiation. The substrate is in glassy carbon to prevent it to fluoresce. The PIXE results are compared with Monte-Carlo simulation (MCNPX) and with the theoretical model of DuMond et al. A very good agreement is observed. {\textcopyright} 2005 Elsevier B.V. All rights reserved.",

keywords = "Doppler broadening, Monte-Carlo simulations, PIXE",

author = "V.E. Nuttens and R.L. Hubert and F. Bodart and S. Lucas",

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doi = "10.1016/j.nimb.2005.06.132",

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pages = "293--296",

journal = "Nuclear Instruments and Methods in Physical Research B",

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T1 - Investigation of Doppler Broadening of compton line by PIXE

AU - Nuttens, V.E.

AU - Hubert, R.L.

AU - Bodart, F.

AU - Lucas, S.

N1 - Publication code : **RES. ACAD.

PY - 2005

Y1 - 2005

N2 - We have investigated the possibility to highlight the Compton broadening effect using proton-induced X-ray emission. A special configuration of the irradiated sample has been chosen: a very thin rhodium layer deposited on a glassy carbon substrate. The X-rays photons are generated in the thin layer of rhodium owing to the ionisation by the proton irradiation. The substrate is in glassy carbon to prevent it to fluoresce. The PIXE results are compared with Monte-Carlo simulation (MCNPX) and with the theoretical model of DuMond et al. A very good agreement is observed. © 2005 Elsevier B.V. All rights reserved.

AB - We have investigated the possibility to highlight the Compton broadening effect using proton-induced X-ray emission. A special configuration of the irradiated sample has been chosen: a very thin rhodium layer deposited on a glassy carbon substrate. The X-rays photons are generated in the thin layer of rhodium owing to the ionisation by the proton irradiation. The substrate is in glassy carbon to prevent it to fluoresce. The PIXE results are compared with Monte-Carlo simulation (MCNPX) and with the theoretical model of DuMond et al. A very good agreement is observed. © 2005 Elsevier B.V. All rights reserved.

KW - Doppler broadening

KW - Monte-Carlo simulations

KW - PIXE

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DO - 10.1016/j.nimb.2005.06.132

M3 - Article

VL - 240

SP - 293

EP - 296

JO - Nuclear Instruments and Methods in Physical Research B

JF - Nuclear Instruments and Methods in Physical Research B

SN - 0168-583X

IS - 1-2

ER -

Investigation of Doppler Broadening of compton line by PIXE

Abstract

Keywords

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Synthesis, Irradiation and Analysis of Materials (SIAM)

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