Investigation of Doppler Broadening of compton line by PIXE

V.E. Nuttens, R.L. Hubert, F. Bodart, S. Lucas

Research output: Contribution to journalArticlepeer-review

Abstract

We have investigated the possibility to highlight the Compton broadening effect using proton-induced X-ray emission. A special configuration of the irradiated sample has been chosen: a very thin rhodium layer deposited on a glassy carbon substrate. The X-rays photons are generated in the thin layer of rhodium owing to the ionisation by the proton irradiation. The substrate is in glassy carbon to prevent it to fluoresce. The PIXE results are compared with Monte-Carlo simulation (MCNPX) and with the theoretical model of DuMond et al. A very good agreement is observed. © 2005 Elsevier B.V. All rights reserved.
Original languageEnglish
Pages (from-to)293-296
Number of pages4
JournalNuclear Instruments and Methods in Physics Research B- Beam interactions with material and atoms
Volume240
Issue number1-2
DOIs
Publication statusPublished - 2005

Keywords

  • Doppler broadening
  • Monte-Carlo simulations
  • PIXE

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