Investigation of Doppler Broadening of compton line by PIXE

Research output: Contribution to journalArticle

Abstract

We have investigated the possibility to highlight the Compton broadening effect using proton-induced X-ray emission. A special configuration of the irradiated sample has been chosen: a very thin rhodium layer deposited on a glassy carbon substrate. The X-rays photons are generated in the thin layer of rhodium owing to the ionisation by the proton irradiation. The substrate is in glassy carbon to prevent it to fluoresce. The PIXE results are compared with Monte-Carlo simulation (MCNPX) and with the theoretical model of DuMond et al. A very good agreement is observed. © 2005 Elsevier B.V. All rights reserved.
Original languageEnglish
Pages (from-to)293-296
Number of pages4
JournalNuclear Instruments and Methods in Physics Research B- Beam interactions with material and atoms
Volume240
Issue number1-2
DOIs
Publication statusPublished - 2005

Fingerprint

Doppler effect
glassy carbon
Glassy carbon
Rhodium
rhodium
Proton irradiation
X rays
proton irradiation
Substrates
Ionization
Protons
x rays
Photons
ionization
protons
photons
configurations
simulation
Monte Carlo simulation

Keywords

  • Doppler broadening
  • Monte-Carlo simulations
  • PIXE

Cite this

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title = "Investigation of Doppler Broadening of compton line by PIXE",
abstract = "We have investigated the possibility to highlight the Compton broadening effect using proton-induced X-ray emission. A special configuration of the irradiated sample has been chosen: a very thin rhodium layer deposited on a glassy carbon substrate. The X-rays photons are generated in the thin layer of rhodium owing to the ionisation by the proton irradiation. The substrate is in glassy carbon to prevent it to fluoresce. The PIXE results are compared with Monte-Carlo simulation (MCNPX) and with the theoretical model of DuMond et al. A very good agreement is observed. {\circledC} 2005 Elsevier B.V. All rights reserved.",
keywords = "Doppler broadening, Monte-Carlo simulations, PIXE",
author = "V.E. Nuttens and R.L. Hubert and F. Bodart and S. Lucas",
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journal = "Nuclear Instruments and Methods in Physical Research B",
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T1 - Investigation of Doppler Broadening of compton line by PIXE

AU - Nuttens, V.E.

AU - Hubert, R.L.

AU - Bodart, F.

AU - Lucas, S.

N1 - Publication code : **RES. ACAD.

PY - 2005

Y1 - 2005

N2 - We have investigated the possibility to highlight the Compton broadening effect using proton-induced X-ray emission. A special configuration of the irradiated sample has been chosen: a very thin rhodium layer deposited on a glassy carbon substrate. The X-rays photons are generated in the thin layer of rhodium owing to the ionisation by the proton irradiation. The substrate is in glassy carbon to prevent it to fluoresce. The PIXE results are compared with Monte-Carlo simulation (MCNPX) and with the theoretical model of DuMond et al. A very good agreement is observed. © 2005 Elsevier B.V. All rights reserved.

AB - We have investigated the possibility to highlight the Compton broadening effect using proton-induced X-ray emission. A special configuration of the irradiated sample has been chosen: a very thin rhodium layer deposited on a glassy carbon substrate. The X-rays photons are generated in the thin layer of rhodium owing to the ionisation by the proton irradiation. The substrate is in glassy carbon to prevent it to fluoresce. The PIXE results are compared with Monte-Carlo simulation (MCNPX) and with the theoretical model of DuMond et al. A very good agreement is observed. © 2005 Elsevier B.V. All rights reserved.

KW - Doppler broadening

KW - Monte-Carlo simulations

KW - PIXE

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DO - 10.1016/j.nimb.2005.06.132

M3 - Article

VL - 240

SP - 293

EP - 296

JO - Nuclear Instruments and Methods in Physical Research B

JF - Nuclear Instruments and Methods in Physical Research B

SN - 0168-583X

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