We have investigated the possibility to highlight the Compton broadening effect using proton-induced X-ray emission. A special configuration of the irradiated sample has been chosen: a very thin rhodium layer deposited on a glassy carbon substrate. The X-rays photons are generated in the thin layer of rhodium owing to the ionisation by the proton irradiation. The substrate is in glassy carbon to prevent it to fluoresce. The PIXE results are compared with Monte-Carlo simulation (MCNPX) and with the theoretical model of DuMond et al. A very good agreement is observed. © 2005 Elsevier B.V. All rights reserved.
|Number of pages||4|
|Journal||Nuclear Instruments and Methods in Physics Research B- Beam interactions with material and atoms|
|Publication status||Published - 2005|
- Doppler broadening
- Monte-Carlo simulations
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Technological Platform Synthesis, Irradiation and Analysis of Materials
Facility/equipment: Technological Platform