Inverse photoemission study of non-reconstructed Si(111) surfaces: a comparison between H-Si(111)1x1 and As:Si(111)1x1

Jean-Louis Guyaux, Saidi Bouzidi, Véronique LANGLAIS, Hafid BELKHIR, Jean-Marie DEBEVER, Paul Thiry

    Research output: Contribution to journalArticle

    Original languageFrench
    Pages (from-to)1244-1249
    Number of pages6
    JournalSurface Science
    Volume331-333
    Publication statusPublished - 1995

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