Inverse photoemission spectroscopy of the prototypical Si(111): As 1x1 surface

Saidi Bouzidi, Thierry ANGOT, François COLETTI, Jean-Marie DEBEVER, Jean-Louis Guyaux, Paul Thiry

    Research output: Contribution in Book/Catalog/Report/Conference proceedingChapter

    Original languageFrench
    Title of host publicationProceedings of the 4th International Conference on the formation of Semiconductor Interfaces (Jülich 1993)
    EditorsH Lüth, W Mönch, J Pollmann
    Pages649-652
    Number of pages4
    Publication statusPublished - 1994

    Cite this