Original language | English |
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Journal | Journal of the American Society for Mass Spectrometry |
Volume | 20 |
Publication status | Published - 2009 |
Influence of the organic layer thickness in (metal-assisted) secondary ion mass spectrometry using Ga+ and C60+ projectiles
Nimer Wehbe, Taoufiq Mouhib, Aneesh Prabhakaran, Patrick Bertrand, Arnaud Delcorte
Research output: Contribution to journal › Article › peer-review