Influence of structural defects on Fresnel projection microscope images of carbon nanotubes: Implications for the characterization of nanoscale devices

Christophe Adessi; Michel Devel; [No Value] Vu thien binh; Philippe Lambin; Vincent Meunier

doi:10.1103/PhysRevB.61.R13385

Influence of structural defects on Fresnel projection microscope images of carbon nanotubes: Implications for the characterization of nanoscale devices

Christophe Adessi, Michel Devel, [No Value] Vu thien binh, Philippe Lambin, Vincent Meunier

Research output: Contribution to journal › Article

Abstract

We report first quantum theoretical simulations of Fresnel type electronic diffraction images of carbon nanotubes junctions. These three-dimensional simulations are used to interpret fine features of experimental Fresnel projection microscope (FPM) images. The relevance of the FPM to observe nanodevices made from carbon nanotubes is then discussed.

Original language	English
Pages (from-to)	13385-13388
Number of pages	4
Journal	Physical Review. B, Condensed Matter and Materials Physics
Volume	61
Issue number	20
DOIs	https://doi.org/10.1103/PhysRevB.61.R13385
Publication status	Published - 2000

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10.1103/PhysRevB.61.R13385

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title = "Influence of structural defects on Fresnel projection microscope images of carbon nanotubes: Implications for the characterization of nanoscale devices",

abstract = "We report first quantum theoretical simulations of Fresnel type electronic diffraction images of carbon nanotubes junctions. These three-dimensional simulations are used to interpret fine features of experimental Fresnel projection microscope (FPM) images. The relevance of the FPM to observe nanodevices made from carbon nanotubes is then discussed.",

author = "Christophe Adessi and Michel Devel and {Vu thien binh}, {[No Value]} and Philippe Lambin and Vincent Meunier",

year = "2000",

doi = "10.1103/PhysRevB.61.R13385",

language = "English",

volume = "61",

pages = "13385--13388",

journal = "Physical Review. B, Condensed Matter and Materials Physics",

issn = "1098-0121",

publisher = "American Institute of Physics Publising LLC",

number = "20",

}

Influence of structural defects on Fresnel projection microscope images of carbon nanotubes: Implications for the characterization of nanoscale devices. / Adessi, Christophe; Devel, Michel; Vu thien binh, [No Value] et al.
In: Physical Review. B, Condensed Matter and Materials Physics, Vol. 61, No. 20, 2000, p. 13385-13388.

Research output: Contribution to journal › Article

TY - JOUR

T1 - Influence of structural defects on Fresnel projection microscope images of carbon nanotubes

T2 - Implications for the characterization of nanoscale devices

AU - Adessi, Christophe

AU - Devel, Michel

AU - Vu thien binh, [No Value]

AU - Lambin, Philippe

AU - Meunier, Vincent

PY - 2000

Y1 - 2000

N2 - We report first quantum theoretical simulations of Fresnel type electronic diffraction images of carbon nanotubes junctions. These three-dimensional simulations are used to interpret fine features of experimental Fresnel projection microscope (FPM) images. The relevance of the FPM to observe nanodevices made from carbon nanotubes is then discussed.

AB - We report first quantum theoretical simulations of Fresnel type electronic diffraction images of carbon nanotubes junctions. These three-dimensional simulations are used to interpret fine features of experimental Fresnel projection microscope (FPM) images. The relevance of the FPM to observe nanodevices made from carbon nanotubes is then discussed.

U2 - 10.1103/PhysRevB.61.R13385

DO - 10.1103/PhysRevB.61.R13385

M3 - Article

SN - 1098-0121

VL - 61

SP - 13385

EP - 13388

JO - Physical Review. B, Condensed Matter and Materials Physics

JF - Physical Review. B, Condensed Matter and Materials Physics

IS - 20

ER -

Influence of structural defects on Fresnel projection microscope images of carbon nanotubes: Implications for the characterization of nanoscale devices

Abstract

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