Individual multiwall carbon nanotube spectroscopy by scanning transmission -ray microscopy: structural and electronic properties

Alexandre Felten; Carla Bittencourt Papaleo Montes; Jean-Jacques Pireaux; M Reichelt; J Mayer; Daniel Hernandez Cruz; Adam Hitchcock

Individual multiwall carbon nanotube spectroscopy by scanning transmission -ray microscopy: structural and electronic properties

Alexandre Felten, Carla Bittencourt Papaleo Montes, Jean-Jacques Pireaux, M Reichelt, J Mayer, Daniel Hernandez Cruz, Adam Hitchcock

Namur Research Institute for Life Sciences

Research output: Contribution to journal › Article › peer-review

Original language	English
Journal	Nano Letters
Volume	7
Publication status	Published - 2007

Synthesis, Irradiation and Analysis of Materials (SIAM)
Pierre Louette (Manager), Julien Colaux (Manager), Alexandre Felten (Manager), Tijani Tabarrant (Operator), Frederic COME (Operator) & Paul-Louis Debarsy (Manager)
Technological Platform Synthesis, Irradiation and Analysis of Materials
Facility/equipment: Technological Platform

Cite this

@article{5b34fceb165e42ccb47b23504cacb058,

title = "Individual multiwall carbon nanotube spectroscopy by scanning transmission -ray microscopy: structural and electronic properties",

author = "Alexandre Felten and {Bittencourt Papaleo Montes}, Carla and Jean-Jacques Pireaux and M Reichelt and J Mayer and {Hernandez Cruz}, Daniel and Adam Hitchcock",

year = "2007",

language = "English",

volume = "7",

journal = "Nano Letters",

publisher = "American Chemical Society",

}

TY - JOUR

T1 - Individual multiwall carbon nanotube spectroscopy by scanning transmission -ray microscopy: structural and electronic properties

AU - Felten, Alexandre

AU - Bittencourt Papaleo Montes, Carla

AU - Pireaux, Jean-Jacques

AU - Reichelt, M

AU - Mayer, J

AU - Hernandez Cruz, Daniel

AU - Hitchcock, Adam

PY - 2007

Y1 - 2007

M3 - Article

VL - 7

JO - Nano Letters

JF - Nano Letters

ER -

Individual multiwall carbon nanotube spectroscopy by scanning transmission -ray microscopy: structural and electronic properties

Equipment

Synthesis, Irradiation and Analysis of Materials (SIAM)

Cite this