Impact of the anchoring groups X (-SH,-S-S-, -SeH and -Se-Se-) of CF3(CF2)4(CH2)11X molecules self-assembled on oxidised electroplated copper

Zineb Mekhalif; Gregory Fonder; Denis Auguste; Fabrice Laffineur; Joseph Delhalle

Impact of the anchoring groups X (-SH,-S-S-, -SeH and -Se-Se-) of CF3(CF2)4(CH2)11X molecules self-assembled on oxidised electroplated copper

Zineb Mekhalif, Gregory Fonder, Denis Auguste, Fabrice Laffineur, Joseph Delhalle

Research output: Contribution to journal › Article

Original language	English
Pages (from-to)	24-32
Number of pages	9
Journal	Journal of Electroanalytical Chemistry
Volume	618
Issue number	1-2
Publication status	Published - 2008

Synthesis, Irradiation and Analysis of Materials (SIAM)
Louette, P. (Manager), Colaux, J. (Manager), Felten, A. (Manager), Tabarrant, T. (Operator), COME, F. (Operator) & Debarsy, P.-L. (Manager)
Technological Platform Synthesis, Irradiation and Analysis of Materials
Facility/equipment: Technological Platform

Cite this

@article{cf157f18139a4cee972701c51f3cf360,

title = "Impact of the anchoring groups X (-SH,-S-S-, -SeH and -Se-Se-) of CF3(CF2)4(CH2)11X molecules self-assembled on oxidised electroplated copper",

author = "Zineb Mekhalif and Gregory Fonder and Denis Auguste and Fabrice Laffineur and Joseph Delhalle",

year = "2008",

language = "English",

volume = "618",

pages = "24--32",

journal = "Journal of Electroanalytical Chemistry",

publisher = "Elsevier",

number = "1-2",

}

TY - JOUR

T1 - Impact of the anchoring groups X (-SH,-S-S-, -SeH and -Se-Se-) of CF3(CF2)4(CH2)11X molecules self-assembled on oxidised electroplated copper

AU - Mekhalif, Zineb

AU - Fonder, Gregory

AU - Auguste, Denis

AU - Laffineur, Fabrice

AU - Delhalle, Joseph

PY - 2008

Y1 - 2008

M3 - Article

VL - 618

SP - 24

EP - 32

JO - Journal of Electroanalytical Chemistry

JF - Journal of Electroanalytical Chemistry

IS - 1-2

ER -

Impact of the anchoring groups X (-SH,-S-S-, -SeH and -Se-Se-) of CF3(CF2)4(CH2)11X molecules self-assembled on oxidised electroplated copper

Equipment

Synthesis, Irradiation and Analysis of Materials (SIAM)

Cite this