Hybrid organic/inorganic materials depth profiling by ToF-SIMS using low energy cesium ions

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• Depth profiling of hybrid multilayers using ToF-SIMS: from model samples to photonic devices

  Noel, C. (Author)Houssiau, L. (Supervisor), Cecchet, F. (President), Busby, Y. (Jury), Delcorte, A. (Jury), Galtayries, A. (Jury) & Bernard, L. (Jury), 8 Apr 2019

  Student thesis: Doc types › Doctor of Sciences

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