Hybrid organic/inorganic materials depth profiling by ToF-SIMS using low energy cesium ions

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• Synthesis, Irradiation and Analysis of Materials (SIAM)

  Pierre Louette (Manager), Julien Colaux (Manager), Alexandre Felten (Manager), Tijani Tabarrant (Operator), Frederic COME (Operator) & Paul-Louis Debarsy (Manager)

  Technological Platform Synthesis, Irradiation and Analysis of Materials

  Facility/equipment: Technological Platform