Original language | English |
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Journal | Journal of the American Society for Mass Spectrometry |
Early online date | 10 Feb 2016 |
DOIs | |
Publication status | E-pub ahead of print - 10 Feb 2016 |
Equipment
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Synthesis, Irradiation and Analysis of Materials (SIAM)
Louette, P. (Manager), Colaux, J. (Manager), Felten, A. (Manager), Tabarrant, T. (Operator), COME, F. (Operator) & Debarsy, P.-L. (Manager)
Technological Platform Synthesis, Irradiation and Analysis of MaterialsFacility/equipment: Technological Platform
Student theses
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Depth profiling of hybrid multilayers using ToF-SIMS: from model samples to photonic devices
Noel, C. (Author), Houssiau, L. (Supervisor), Cecchet, F. (President), Busby, Y. (Jury), Delcorte, A. (Jury), Galtayries, A. (Jury) & Bernard, L. (Jury), 8 Apr 2019Student thesis: Doc types › Doctor of Sciences
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