Hybrid organic/inorganic materials depth profiling by ToF-SIMS using low energy cesium ions

Research output: Contribution to journal › Article › peer-review

Original language	English
Journal	Journal of the American Society for Mass Spectrometry
Early online date	10 Feb 2016
DOIs	https://doi.org/10.1007/s13361-016-1353-9
Publication status	E-pub ahead of print - 10 Feb 2016

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Depth profiling of hybrid multilayers using ToF-SIMS: from model samples to photonic devices
Noel, C. (Author), Houssiau, L. (Supervisor), Cecchet, F. (President), Busby, Y. (Jury), Delcorte, A. (Jury), Galtayries, A. (Jury) & Bernard, L. (Jury), 8 Apr 2019
Student thesis: Doc types › Doctor of Sciences

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