High-resolution Electron-Energy-Loss Spectroscopy of thin films of C60 on Si(100)

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)2171-2174
Number of pages4
JournalPhysical review letters
Volume67
Issue number16
Publication statusPublished - 1991

Cite this

@article{57699a8f069646af866ba6f5510aeb85,
title = "High-resolution Electron-Energy-Loss Spectroscopy of thin films of C60 on Si(100)",
author = "Georg Gensterblum and Jean-Jacques Pireaux and Paul Thiry and Roland Caudano and Jean-Pol Vigneron and Philippe Lambin and Amand Lucas and Wolfgang KR{\"A}TSCHMER",
year = "1991",
language = "English",
volume = "67",
pages = "2171--2174",
journal = "Physical review letters",
issn = "0031-9007",
publisher = "American Physical Society",
number = "16",

}

High-resolution Electron-Energy-Loss Spectroscopy of thin films of C60 on Si(100). / Gensterblum, Georg; Pireaux, Jean-Jacques; Thiry, Paul; Caudano, Roland; Vigneron, Jean-Pol; Lambin, Philippe; Lucas, Amand; KRÄTSCHMER, Wolfgang.

In: Physical review letters, Vol. 67, No. 16, 1991, p. 2171-2174.

Research output: Contribution to journalArticle

TY - JOUR

T1 - High-resolution Electron-Energy-Loss Spectroscopy of thin films of C60 on Si(100)

AU - Gensterblum, Georg

AU - Pireaux, Jean-Jacques

AU - Thiry, Paul

AU - Caudano, Roland

AU - Vigneron, Jean-Pol

AU - Lambin, Philippe

AU - Lucas, Amand

AU - KRÄTSCHMER, Wolfgang

PY - 1991

Y1 - 1991

M3 - Article

VL - 67

SP - 2171

EP - 2174

JO - Physical review letters

JF - Physical review letters

SN - 0031-9007

IS - 16

ER -