High-resolution Electron-Energy-Loss Spectroscopy of thin films of C60 on Si(100)

Georg Gensterblum; Jean-Jacques Pireaux; Paul Thiry; Roland Caudano; Jean-Pol Vigneron; Philippe Lambin; Amand Lucas; Wolfgang KRÄTSCHMER

High-resolution Electron-Energy-Loss Spectroscopy of thin films of C₆₀ on Si(100)

Georg Gensterblum, Jean-Jacques Pireaux, Paul Thiry, Roland Caudano, Jean-Pol Vigneron, Philippe Lambin, Amand Lucas, Wolfgang KRÄTSCHMER

Namur Research Institute for Life Sciences

Research output: Contribution to journal › Article

Original language	English
Pages (from-to)	2171-2174
Number of pages	4
Journal	Physical review letters
Volume	67
Issue number	16
Publication status	Published - 1991

Cite this

@article{57699a8f069646af866ba6f5510aeb85,

title = "High-resolution Electron-Energy-Loss Spectroscopy of thin films of C60 on Si(100)",

author = "Georg Gensterblum and Jean-Jacques Pireaux and Paul Thiry and Roland Caudano and Jean-Pol Vigneron and Philippe Lambin and Amand Lucas and Wolfgang KR{\"A}TSCHMER",

year = "1991",

language = "English",

volume = "67",

pages = "2171--2174",

journal = "Physical review letters",

issn = "1079-7114",

publisher = "American Physical Society",

number = "16",

}

TY - JOUR

T1 - High-resolution Electron-Energy-Loss Spectroscopy of thin films of C60 on Si(100)

AU - Gensterblum, Georg

AU - Pireaux, Jean-Jacques

AU - Thiry, Paul

AU - Caudano, Roland

AU - Vigneron, Jean-Pol

AU - Lambin, Philippe

AU - Lucas, Amand

AU - KRÄTSCHMER, Wolfgang

PY - 1991

Y1 - 1991

M3 - Article

SN - 1079-7114

VL - 67

SP - 2171

EP - 2174

JO - Physical review letters

JF - Physical review letters

IS - 16

ER -