Fourier transform analysis of STM images of multilayer graphene moiré patterns

Frédéric Joucken; Fernande Frising; Robert Sporken

doi:10.1016/j.carbon.2014.11.030

Fourier transform analysis of STM images of multilayer graphene moiré patterns

Frédéric Joucken
, Fernande Frising
, Robert Sporken

Research output: Contribution to journal › Article › peer-review

Abstract

With the help of a simple model, we analyze Scanning Tunneling Microscopy images of simple and double moiré patterns resulting from misoriented bi- and tri-layers graphene stacks. It is found that the model reproduces surprisingly well non-trivial features observed in the Fast Fourier Transform of the images. We point out difficulties due to those features in interpreting the patterns seen on the FFT.

Original language	English
Pages (from-to)	48-52
Number of pages	5
Journal	Carbon
Volume	83
Early online date	20 Nov 2014
DOIs	https://doi.org/10.1016/j.carbon.2014.11.030
Publication status	Published - 1 Mar 2015

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10.1016/j.carbon.2014.11.030

http://www.sciencedirect.com/science/article/pii/S0008622314011026#

Scanning Tunneling Microscopy
Sporken, R. (Manager)
Technological Platform Morphology - Imaging
Facility/equipment: Equipment
Synthesis, Irradiation and Analysis of Materials (SIAM)
Louette, P. (Manager), Colaux, J. (Manager), Felten, A. (Manager), Tabarrant, T. (Operator), COME, F. (Operator) & Debarsy, P.-L. (Manager)
Technological Platform Synthesis, Irradiation and Analysis of Materials
Facility/equipment: Technological Platform

Cite this

@article{d9d437a1eb5e46c9918345903914e540,

title = "Fourier transform analysis of STM images of multilayer graphene moir{\'e} patterns",

abstract = "With the help of a simple model, we analyze Scanning Tunneling Microscopy images of simple and double moir{\'e} patterns resulting from misoriented bi- and tri-layers graphene stacks. It is found that the model reproduces surprisingly well non-trivial features observed in the Fast Fourier Transform of the images. We point out difficulties due to those features in interpreting the patterns seen on the FFT.",

author = "Fr{\'e}d{\'e}ric Joucken and Fernande Frising and Robert Sporken",

year = "2015",

month = mar,

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doi = "10.1016/j.carbon.2014.11.030",

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journal = "Carbon",

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T1 - Fourier transform analysis of STM images of multilayer graphene moiré patterns

AU - Joucken, Frédéric

AU - Frising, Fernande

AU - Sporken, Robert

PY - 2015/3/1

Y1 - 2015/3/1

N2 - With the help of a simple model, we analyze Scanning Tunneling Microscopy images of simple and double moiré patterns resulting from misoriented bi- and tri-layers graphene stacks. It is found that the model reproduces surprisingly well non-trivial features observed in the Fast Fourier Transform of the images. We point out difficulties due to those features in interpreting the patterns seen on the FFT.

AB - With the help of a simple model, we analyze Scanning Tunneling Microscopy images of simple and double moiré patterns resulting from misoriented bi- and tri-layers graphene stacks. It is found that the model reproduces surprisingly well non-trivial features observed in the Fast Fourier Transform of the images. We point out difficulties due to those features in interpreting the patterns seen on the FFT.

U2 - 10.1016/j.carbon.2014.11.030

DO - 10.1016/j.carbon.2014.11.030

M3 - Article

AN - SCOPUS:84916911970

SN - 0008-6223

VL - 83

SP - 48

EP - 52

JO - Carbon

JF - Carbon

ER -

Fourier transform analysis of STM images of multilayer graphene moiré patterns

Abstract

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Equipment

Scanning Tunneling Microscopy

Synthesis, Irradiation and Analysis of Materials (SIAM)

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