Excimer laser (λ = 193 nm) versus AlKα X-Ray damages on polymer surfaces: an XPS (core and valence levels) analysis of polytetrafluoroethylene, polypropylene and polyethylene

Jean-Jacques Pireaux, R. de Meulemeester, E.M. Roberfroid, Chantal Grégoire, M. Chtaïb, Yvan Novis, Joseph Riga, Roland Caudano

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)186-191
Number of pages6
JournalNucl. Instr. Meth. in Physics Res., B
Publication statusPublished - 1995

Cite this