Excimer laser (λ = 193 nm) versus AlKα X-Ray damages on polymer surfaces: an XPS (core and valence levels) analysis of polytetrafluoroethylene, polypropylene and polyethylene

Jean-Jacques Pireaux; R. de Meulemeester; E.M. Roberfroid; Chantal Grégoire; M. Chtaïb; Yvan Novis; Joseph Riga; Roland Caudano

Excimer laser (λ = 193 nm) versus AlKα X-Ray damages on polymer surfaces: an XPS (core and valence levels) analysis of polytetrafluoroethylene, polypropylene and polyethylene

Jean-Jacques Pireaux, R. de Meulemeester, E.M. Roberfroid, Chantal Grégoire, M. Chtaïb, Yvan Novis, Joseph Riga, Roland Caudano

Namur Research Institute for Life Sciences

Research output: Contribution to journal › Article

Original language	English
Pages (from-to)	186-191
Number of pages	6
Journal	Nucl. Instr. Meth. in Physics Res., B
Volume	105
Publication status	Published - 1995

Cite this

@article{2a794eca9abd4a04a298a52f3d573266,

title = "Excimer laser (λ = 193 nm) versus AlKα X-Ray damages on polymer surfaces: an XPS (core and valence levels) analysis of polytetrafluoroethylene, polypropylene and polyethylene",

author = "Jean-Jacques Pireaux and {de Meulemeester}, R. and E.M. Roberfroid and Chantal Gr{\'e}goire and M. Chta{\"i}b and Yvan Novis and Joseph Riga and Roland Caudano",

year = "1995",

language = "English",

volume = "105",

pages = "186--191",

journal = "Nuclear Instruments and Methods in Physical Research B",

issn = "0168-583X",

publisher = "Elsevier",

}

Excimer laser (λ = 193 nm) versus AlKα X-Ray damages on polymer surfaces : an XPS (core and valence levels) analysis of polytetrafluoroethylene, polypropylene and polyethylene. / Pireaux, Jean-Jacques; de Meulemeester, R.; Roberfroid, E.M. et al.

In: Nucl. Instr. Meth. in Physics Res., B, Vol. 105, 1995, p. 186-191.

Research output: Contribution to journal › Article

TY - JOUR

T1 - Excimer laser (λ = 193 nm) versus AlKα X-Ray damages on polymer surfaces

T2 - an XPS (core and valence levels) analysis of polytetrafluoroethylene, polypropylene and polyethylene

AU - Pireaux, Jean-Jacques

AU - de Meulemeester, R.

AU - Roberfroid, E.M.

AU - Grégoire, Chantal

AU - Chtaïb, M.

AU - Novis, Yvan

AU - Riga, Joseph

AU - Caudano, Roland

PY - 1995

Y1 - 1995

M3 - Article

SN - 0168-583X

VL - 105

SP - 186

EP - 191

JO - Nuclear Instruments and Methods in Physical Research B

JF - Nuclear Instruments and Methods in Physical Research B

ER -