Epitaxial LSMO films grown on MgO single crystalline substrates

M. Španková, S. Chromik, I. Vávra, K. Sedláčková, P. Lobotka, S. Lucas, S. Stanček

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The manganite LaSrMnO (LSMO) layers are deposited on single crystal MgO(0 0 1) substrates using a magnetron dc sputtering. The crystalline perfection of the layers, both the as-prepared and the annealed, are characterized by X-ray diffraction technique, rocking curve measurements, Rutherford backscattering spectroscopy (RBS) and transmission electron microscopy (TEM). TEM analyses give evidence of the epitaxial growth of the annealed LSMO with a nanocrystalline surface layer. The temperature dependence of resistance in the 77-340 K range is measured by a standard four-probe technique. While the as-prepared film does not show any transition from paramagnetic to ferromagnetic state, the film annealed in oxygen shows steep R(T) dependence with a peak at 330 K and maximal slope (dR/dT) at 290 K where the maximal sensitivity is 3% K.
Original languageEnglish
Pages (from-to)7599-7603
Number of pages5
JournalApplied Surface Science
Issue number18
Publication statusPublished - 15 Jul 2007


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