Electronic structure, bonding, and lithium migration effects involving the surface of the mixed conductor beta - LiAl

Irina M. Curelaru; K.S. Din; G.E. Jang; Ernst-Eckard Koch; Karsten Horn; Jacques Ghijsen; Robert L. Johnson; S. Susman; T.O. Brun; K.J. Volin

Electronic structure, bonding, and lithium migration effects involving the surface of the mixed conductor beta - LiAl

Irina M. Curelaru, K.S. Din, G.E. Jang, Ernst-Eckard Koch, Karsten Horn, Jacques Ghijsen, Robert L. Johnson, S. Susman, T.O. Brun, K.J. Volin

Research output: Contribution in Book/Catalog/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Science and technology of fast ion conductors
Editors	H.L. Tuller, M. Balkanski
Publisher	Plenum Press
Pages	339-344
Number of pages	6
Publication status	Published - 1989
Externally published	Yes

Cite this

Curelaru, I. M., Din, K. S., Jang, G. E., Koch, E-E., Horn, K., Ghijsen, J., Johnson, R. L., Susman, S., Brun, T. O., & Volin, K. J. (1989). Electronic structure, bonding, and lithium migration effects involving the surface of the mixed conductor beta - LiAl. In H. L. Tuller, & M. Balkanski (Eds.), Science and technology of fast ion conductors (pp. 339-344). Plenum Press.

Curelaru, Irina M. ; Din, K.S. ; Jang, G.E. ; Koch, Ernst-Eckard ; Horn, Karsten ; Ghijsen, Jacques ; Johnson, Robert L. ; Susman, S. ; Brun, T.O. ; Volin, K.J. / Electronic structure, bonding, and lithium migration effects involving the surface of the mixed conductor beta - LiAl. Science and technology of fast ion conductors. editor / H.L. Tuller ; M. Balkanski. Plenum Press, 1989. pp. 339-344

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author = "Curelaru, {Irina M.} and K.S. Din and G.E. Jang and Ernst-Eckard Koch and Karsten Horn and Jacques Ghijsen and Johnson, {Robert L.} and S. Susman and T.O. Brun and K.J. Volin",

year = "1989",

language = "English",

pages = "339--344",

editor = "H.L. Tuller and M. Balkanski",

booktitle = "Science and technology of fast ion conductors",

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Electronic structure, bonding, and lithium migration effects involving the surface of the mixed conductor beta - LiAl. / Curelaru, Irina M.; Din, K.S.; Jang, G.E.; Koch, Ernst-Eckard; Horn, Karsten; Ghijsen, Jacques; Johnson, Robert L.; Susman, S.; Brun, T.O.; Volin, K.J.

Science and technology of fast ion conductors. ed. / H.L. Tuller; M. Balkanski. Plenum Press, 1989. p. 339-344.

Research output: Contribution in Book/Catalog/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Electronic structure, bonding, and lithium migration effects involving the surface of the mixed conductor beta - LiAl

AU - Curelaru, Irina M.

AU - Din, K.S.

AU - Jang, G.E.

AU - Koch, Ernst-Eckard

AU - Horn, Karsten

AU - Ghijsen, Jacques

AU - Johnson, Robert L.

AU - Susman, S.

AU - Brun, T.O.

AU - Volin, K.J.

PY - 1989

Y1 - 1989

M3 - Conference contribution

SP - 339

EP - 344

BT - Science and technology of fast ion conductors

A2 - Tuller, H.L.

A2 - Balkanski, M.

PB - Plenum Press

ER -