Electronic States and Band Lineups in c-Si(100)/a-Si1-xCx Heterojunctions

T. M. Brown, Carla Bittencourt Papaleo Montes, M. Sebastiani, F. Evangelisti

    Research output: Contribution to journalArticle

    Abstract

    Heterostructures formed by depositing in situ amorphous hydrogenated silicon-carbon alloys on Si(100) substrates were characterized by photoelectric-yield spectroscopy, UPS, and XPS. It is shown that both substrate and overlayer valence-band tops can be identified on the photoelectric-yield spectrum, thus allowing a direct and precise determination of the band lineup. We find a valence-band discontinuity varying from 0.44 eV to 1.00 eV for carbon content ranging from 0 to 50%. The present data can be used as a test for the lineup theories and strongly support the interface dipole models.
    Original languageEnglish
    Pages (from-to)9904
    JournalPhysical review. B, Condensed matter
    Volume55
    Issue number15
    DOIs
    Publication statusPublished - 1997

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