TY - JOUR
T1 - Electron energy loss spectroscopy of surface and interface phonons of insulators, semiconductors and superlattices
AU - Thiry, Paul
AU - Lucas, Amand
AU - Vigneron, Jean-Pol
AU - Lambin, Philippe
AU - Liehr, Michael
AU - Pireaux, Jean-Jacques
AU - Caudano, Roland
PY - 1986
Y1 - 1986
N2 - This article will start with a review of the Dielectric Theory of Electron Energy Loss Spectroscopy (EELS), in the phonon energy range, at semiconductor or insulator surfaces. Theoretical models will be developed to deal with the effects on the spectrum arising from the electron image interaction, the finite electron penetration into the substrate and the anisotropy of the dielectric function of the crystalline materials. Theoretical predictions for EELS on isotropic semiconductor layered materials will also be presented and an application to superlattices will be explored. When possible, comparison with measurements from materials such as MgO, Al2O3, SnO2, SiO2 and the superlattice GaAs-InAs will be discussed.
AB - This article will start with a review of the Dielectric Theory of Electron Energy Loss Spectroscopy (EELS), in the phonon energy range, at semiconductor or insulator surfaces. Theoretical models will be developed to deal with the effects on the spectrum arising from the electron image interaction, the finite electron penetration into the substrate and the anisotropy of the dielectric function of the crystalline materials. Theoretical predictions for EELS on isotropic semiconductor layered materials will also be presented and an application to superlattices will be explored. When possible, comparison with measurements from materials such as MgO, Al2O3, SnO2, SiO2 and the superlattice GaAs-InAs will be discussed.
U2 - 10.1002/qua.560280860
DO - 10.1002/qua.560280860
M3 - Article
SN - 0020-7608
VL - 28
SP - 687
EP - 705
JO - International Journal of Quantum Chemistry
JF - International Journal of Quantum Chemistry
IS - S19
ER -