Diode-laser spectroscopy: Line profiles of H2O in the region of 1.39 μm

M. Lepère, A. Henry, A. Valentin, C. Camy-Peyret

Research output: Contribution to journalArticlepeer-review

Abstract

Using a stabilized diode-laser spectrometer, we have studied the line profiles of water vapor near 7185.59 cm. With low pressures of pure gas (≤1 Torr) in a White-type cell, we have deduced the line intensities using the Voigt profile. This study shows clear differences between experimental and calculated lines described by a Voigt profile when the pressure increases. For water vapor in mixtures with N, O, Ar, or He, we have determined the collisional broadening coefficients, taking into account the collisional narrowing (Dicke effect). The narrowing parameters have been determined using soft (Galatry) or hard (Rautian and Sobel'man) collision models and compared to the dynamic friction coefficient.
Original languageEnglish
Pages (from-to)25-31
Number of pages7
JournalJournal of molecular spectroscopy
Volume208
Issue number1
DOIs
Publication statusPublished - 1 Jan 2001

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