Diode Laser Measurements of Kr-Broadened Linewidths in the ν1 Band of OCS

Ghislain Blanquet, Jacques Walrand, Jean-Pierre Bouanich

    Research output: Contribution to journalArticlepeer-review

    Original languageEnglish
    Pages (from-to)5366-5371
    Number of pages6
    JournalApplied Optics
    Volume29
    Publication statusPublished - 1990

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