Dielectric enhancement of electric fields for a noble cold cathode

M. S. Chung; J. P. Chun; A. Mayer; N. M. Miskovsky; P. H. Cutler

doi:10.1109/IVEC.2013.6570981

Dielectric enhancement of electric fields for a noble cold cathode

M. S. Chung, J. P. Chun, A. Mayer, N. M. Miskovsky, P. H. Cutler

Research output: Contribution in Book/Catalog/Report/Conference proceeding › Conference contribution

Abstract

Electric fields at metal-dielectric contact were calculated analytically and numerically. The obtained field exhibited enhancements strong enough to cause breakdown at a triple junction and more apparently at a quadruple junction. Such field enhancements may lead to a noble type of cold cathode.

Original language	English
Title of host publication	14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings
DOIs	https://doi.org/10.1109/IVEC.2013.6570981
Publication status	Published - 9 Sept 2013
Event	14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Paris, France Duration: 21 May 2013 → 23 May 2013

Conference

Conference	14th IEEE International Vacuum Electronics Conference, IVEC 2013
Country/Territory	France
City	Paris
Period	21/05/13 → 23/05/13

Keywords

cold cathode
field emission
field enhancement
metal-dielectric contact
triple junction

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10.1109/IVEC.2013.6570981

Cite this

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title = "Dielectric enhancement of electric fields for a noble cold cathode",

abstract = "Electric fields at metal-dielectric contact were calculated analytically and numerically. The obtained field exhibited enhancements strong enough to cause breakdown at a triple junction and more apparently at a quadruple junction. Such field enhancements may lead to a noble type of cold cathode.",

keywords = "cold cathode, field emission, field enhancement, metal-dielectric contact, triple junction",

author = "Chung, {M. S.} and Chun, {J. P.} and A. Mayer and Miskovsky, {N. M.} and Cutler, {P. H.}",

year = "2013",

month = sep,

day = "9",

doi = "10.1109/IVEC.2013.6570981",

language = "English",

isbn = "9781467359757",

booktitle = "14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings",

note = "14th IEEE International Vacuum Electronics Conference, IVEC 2013 ; Conference date: 21-05-2013 Through 23-05-2013",

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TY - GEN

T1 - Dielectric enhancement of electric fields for a noble cold cathode

AU - Chung, M. S.

AU - Chun, J. P.

AU - Mayer, A.

AU - Miskovsky, N. M.

AU - Cutler, P. H.

PY - 2013/9/9

Y1 - 2013/9/9

N2 - Electric fields at metal-dielectric contact were calculated analytically and numerically. The obtained field exhibited enhancements strong enough to cause breakdown at a triple junction and more apparently at a quadruple junction. Such field enhancements may lead to a noble type of cold cathode.

AB - Electric fields at metal-dielectric contact were calculated analytically and numerically. The obtained field exhibited enhancements strong enough to cause breakdown at a triple junction and more apparently at a quadruple junction. Such field enhancements may lead to a noble type of cold cathode.

KW - cold cathode

KW - field emission

KW - field enhancement

KW - metal-dielectric contact

KW - triple junction

UR - http://www.scopus.com/inward/record.url?scp=84883432284&partnerID=8YFLogxK

U2 - 10.1109/IVEC.2013.6570981

DO - 10.1109/IVEC.2013.6570981

M3 - Conference contribution

AN - SCOPUS:84883432284

SN - 9781467359757

BT - 14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings

T2 - 14th IEEE International Vacuum Electronics Conference, IVEC 2013

Y2 - 21 May 2013 through 23 May 2013

ER -

Dielectric enhancement of electric fields for a noble cold cathode

Abstract

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Keywords

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