Dielectric enhancement of electric fields for a noble cold cathode

M. S. Chung, J. P. Chun, A. Mayer, N. M. Miskovsky, P. H. Cutler

    Research output: Contribution in Book/Catalog/Report/Conference proceedingConference contribution

    Abstract

    Electric fields at metal-dielectric contact were calculated analytically and numerically. The obtained field exhibited enhancements strong enough to cause breakdown at a triple junction and more apparently at a quadruple junction. Such field enhancements may lead to a noble type of cold cathode.

    Original languageEnglish
    Title of host publication14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings
    DOIs
    Publication statusPublished - 9 Sep 2013
    Event14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Paris, France
    Duration: 21 May 201323 May 2013

    Conference

    Conference14th IEEE International Vacuum Electronics Conference, IVEC 2013
    Country/TerritoryFrance
    CityParis
    Period21/05/1323/05/13

    Keywords

    • cold cathode
    • field emission
    • field enhancement
    • metal-dielectric contact
    • triple junction

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